IEC 60749-30 pdf – Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

IEC 60749-30 pdf – Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing 5.2Moisture chamber Moisture chamber(s) capable of operating at 85 °C/85 % RH (relative humidity)，85°C/60 %RH，85 *C/30 % RH，30 °C/70 % RH and 30 “C/60 % RH. Within the chamberworking area,temperature tolerance shall be t2 “C...